Speaker: Dr. Sajjad Ahmed, Director Sales and Business Development, Focus Microwaves
Date: July 3, 2025
Time: 10:00am to 1:00pm
Location: EIT 3142
Invited by: Dr. Slim Boumaiza
All are welcome!
Abstract:
This talk will concentrate on load pull measurement techniques, with a focus on vectorial load pull methods for mmWave frequencies. We will examine the differences and applications of passive, hybrid, and active load pull techniques, emphasizing their roles in advanced measurement scenarios. Additionally, we will review the effectiveness, performance, challenges, and integration capabilities of hot wideband load pull solutions. The discussion will conclude with an overview of noise parameter extraction methods and an analysis of their measurement uncertainties.
Biography:
Dr. Sajjad Ahmed earned his Master's in Electronics from the University of Gavle, Sweden, in 2008, and his Ph.D. in Electronics from the University of Limoges in 2012. He is currently the Director of Sales and Business Development at Focus Microwaves, bringing extensive expertise in RF and microwave testing, specializing in non-linear device characterization, load pull techniques, and advanced semiconductor testing at RF/microwave frequencies. He has authored and co-authored multiple journal and conference publications, and he was the recipient of the Outstanding Paper Award for 2014, in the field of optical and laser-based techniques, from the journal Measurement Science and Technology.