Vendor:Ìý
Model:Ìý
Purpose:ÌýSemiconductor microscope for sample inspection and documentation
The MX61 semiconductor inspection microscope provides exceptional image resolution and clarity through observation methods such as brightfield and darkfield.
System features:
- 5 X, 10 X, 20 X, 50 X and 100 X objectives on motorized turret
- Manual stage focus
- Digital imaging with Steam Motion software for calibrated measurements
OLYMPUS-scope2
