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Speaker: Dr. Benoit Derat

Date: June 6, 2025

Time: 11:00 AM - 12:30 PM

Location: Room EIT 3142

All are welcome!

Biography:

Benoit Derat received the Engineering degree from SUPELEC, in 2002, and the Ph.D. degree (Hons.) in physics from the University of Paris XI, in 2006. From 2002 to 2008, he worked at SAGEM Mobiles, as an Antenna Design and Electromagnetics Research Engineer. In 2009, he founded ART-Fi, which created the first vector-array specific absorption rate measurement system. He operated as the CEO and the President of ART-Fi, before joining Rohde & Schwarz, Munich, in 2017. He is currently the Senior Director of Engineering for Vector Network Analyzers, Electromagnetic Compatibility, Over-The-Air and Antenna Test applications. Dr. Derat is a Senior Member of the Antenna Measurement Techniques Association (AMTA) and a Distinguished Lecturer of the IEEE EMC Society (2024 – 2025). He is the author of more than 80 scientific journals and conference papers, and an inventor on more than 40 patents, with main focus in antenna systems near and far-field characterization techniques.

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The proliferation of millimeter-wave technologies, massive MIMO systems, and antenna integration into electrically large platforms such as vehicles has introduced significant challenges in the characterization and validation of radiated performance. As regulatory, performance, and reliability testing converge, the demand for precise Over-the-Air (OTA) measurements at far-field distances is growing—often within existing Electromagnetic Compatibility (EMC) test environments. This lecture unifies two critical and timely questions: 

1. What is the shortest achievable far-field distance that preserves OTA measurement accuracy for a given antenna size, frequency, and metric? 

2. Can a large EMC chamber be reconfigured to serve as a dual-purpose OTA testing facility without compromising compliance or performance evaluation? 

Drawing from recent theoretical developments and empirical investigations, the lecture presents analytical and simulation-based approaches to define the minimum far-field distance that meets specified error tolerances. It introduces practical formulas and charts that relate chamber dimensions, aperture size, and operating frequency to measurement accuracy, enabling engineers to optimize existing infrastructure. In parallel, the talk addresses the technical feasibility of performing OTA measurements in EMC chambers—highlighting architectural differences, absorber requirements, dynamic range considerations, and field uniformity constraints. Design trade-offs and calibration strategies are discussed for repurposing EMC chambers to support dual-use applications, especially in the context of full-vehicle wireless testing. Through real-world examples and validated case studies, the lecture offers guidance to RF test engineers, antenna designers, and facility managers on how to maximize test coverage, reduce cost, and maintain accuracy—all while navigating the complex interplay between intended and unintended radiation measurements.