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URL:/systems-design-engineering/events/grad-seminar-ope
 n-loop-transient-atomic-force-microscopy
SUMMARY:Grad Seminar: Open-loop Transient Atomic Force Microscopy
CLASS:PUBLIC
DESCRIPTION:Summary \n\nABSTRACT\n\nThe Atomic Force Microscope (AFM) is an
  instrument for measuring\, in\nfact “seeing”\, phenomena at nanoscale
  (10−9m) and all the way\ndown to the atomic scale (<10−10m). It was b
 orne out of a need to\nobserve physical reality below the resolution of op
 tical microscopes.\nInvented in 1986 by Binnig\, it has aided scientists\,
  researchers\, and\nengineers spanning many scientific and industrial doma
 ins. The typical\nsensing apparatus of the AFM is a very sharp tip (a few 
 atoms wide)\nattached to the free-end of a fixed-free micro-beam.\n 
DTSTAMP:20250630T063003Z
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